Specifications

Measuring Instruments

CM-3220d

Illumination / Viewing system	Reflectance d:8° equipped with simultaneous measurement of SCI (di:8° specular component included) and SCE (de:8° specular component excluded) Conforms to CIE, ISO, ASTME, DIN and JIS
Sphere size	Ø 52 mm
Light receiving element	Silicon photodiode array (dual 40 elements)
Spectral separation device	Diffraction grating
Wavelength range, pitch	360-740 nm, 10 nm
Halfbandwidth	Approx. 10 nm
Reflectance range	0-200%, resolution 0.01%
Light source	2 pulsed xenon arc lamp
Measurement / Illumination area	Ø 8 mm / Ø 11 mm
Repeatability	Spectral Reflectance: Standard deviation within 0.1% (360 to 380 nm within 0.2%) Colorimetric Value: Standard deviation within ΔE*ab 0.04 Measurement conditions: White calibration plate measured 30 times at 10-second intervals after white calibration was performed
Inter Instrument agreement	Mean ΔE*ab 0.2 (based on 12 BCRA Series II colour tiles)
Dimensions (W x H x D)	232 x 115 x 181 mm
Weight	4 kg